Title of article
Influence of atomic-scale irregularities in fractal analysis of electrode surfaces
Author/Authors
Ali Eftekhari، نويسنده , , Mahmood Kazemzad، نويسنده , , Mansoor Keyanpour-Rad، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
9
From page
311
To page
319
Abstract
To clarify the vague points appeared in the literature, it was discussed that fractal analysis of electrode surfaces based on the
concept of ‘diffusion toward electrode surfaces’ is only able to monitor surface roughness in scales larger than 10 nm. When
inspecting fractality in atomic scale (and even up to 10 nm), electrochemical measurements are not reliable due to the presence
of surface defects, which affect the electrochemical reaction. In other words, for fractal analysis of electrode surfaces, the
diffusion layer width which acts as yardstick length, should be sufficiently large, incomparable to the scale of atomic
inhomogeneities. To this aim, the experiment time should be sufficiently long or the diffusion coefficient should be sufficiently
large.
Keywords
Surface disorder , Atomic imperfection , Fractality scale , Diffusion layer , Length scale , Surface defects , SAXS , Cyclic voltammetry
Journal title
Applied Surface Science
Serial Year
2005
Journal title
Applied Surface Science
Record number
1000536
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