• Title of article

    Corrosion behavior of tin ions implanted zirconium in 1N H2SO4

  • Author/Authors

    D.Q. Peng، نويسنده , , X.D. Bai، نويسنده , , X.W. Chen، نويسنده , , Q.G. Zhou، نويسنده , , X.Y. Liu، نويسنده , , R.H. Yu، نويسنده , , P.Y. Deng، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    11
  • From page
    342
  • To page
    352
  • Abstract
    In order to study the effect of tin ion implantation on the aqueous corrosion behavior of zirconium, specimens were implanted with tin ions to a fluence ranging from 1 1020 to 5 1021 ions/m2, using a metal vapor vacuum arc source (MEVVA) at an extraction voltage of 40 kV. The valence states and depth distributions of elements in the surface layer were analyzed by X-ray photoelectron spectroscopy (XPS) and auger electron spectroscopy (AES) respectively. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were used to examine the micro-morphology and microstructure of tin-implanted samples. When the fluence was greater than 1 1020 ions/m2, many small tin balls were produced in the implanted surface. The potentiodynamic polarization technique was employed to evaluate the aqueous corrosion resistance of implanted zirconium in a 1N H2SO4 solution. It was found that a significant improvement was achieved in the aqueous corrosion resistance of zirconium implanted with 1 1020 ions/m2. When the fluence is higher than 1 1020 ions/m2, the corrosion resistance of zirconium implanted with tin ions decreased compared with that of the non-implanted zirconium. Finally, the mechanism of the corrosion behavior of the tin-implanted zirconium is discussed.
  • Keywords
    zirconium , immersion test , X-ray photoemission spectroscopy (XPS) , Auger electronspectroscopy (AES) , Corrosion resistance , Tin ion implantation
  • Journal title
    Applied Surface Science
  • Serial Year
    2005
  • Journal title
    Applied Surface Science
  • Record number

    1000540