Title of article
Pulsed laser deposition of oxide thin films
Author/Authors
T. Ohnishi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
6
From page
2466
To page
2471
Abstract
The pulsed laser deposition (PLD) process was studied in detail during oxide thin film growth by constructing a sophisticated
PLD chamber combined with an energy-stable excimer laser. It was revealed that the transmitting laser energy at the entrance
view port decreased exponentially with deposition runs, roughly by A e 0.02x%, where A is the original transmission and x is the
run number, and transmission loss could become considerable (up to 90%) in 100 deposition runs. In addition, area of the
focused spot on the target was found a function of charging high voltage, which is a parameter of excimer laser operation, even
through a slit forming rectangular sharp-edge beam profile. Laser energy density is one of the most important parameter
governing grown film properties, and therefore accurate laser energy and spot area calibration is vital for reproducible film
growth. In course of this study, the importance of spot area as well as the energy density is discussed in the view of deposition
rate.
Keywords
Oxide thin film , SrTiO3 , excimer laser , pulsed laser deposition
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1001729
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