• Title of article

    Fundamental studies of the cluster ion bombardment of water ice

  • Author/Authors

    Christopher Szakal، نويسنده , , Joseph Kozole، نويسنده , , Nicholas Winograd، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    3
  • From page
    6526
  • To page
    6528
  • Abstract
    The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native environment. We report on a method of studying amorphous water ice films of precise thicknesses in which pure water vapor is condensed onto a pre-cooled, silver-coated quartz crystal microbalance (QCM). This scheme allows for the determination of water ice sputter yields for any primary projectile as well as providing a means for studying escape depths of atoms and molecules beneath the deposited water ice layer. Specifically, we find a removal of approximately 2500 water molecule equivalents/20 keV C60 + projectile with an underlying silver ion escape depth of 7.0 A°
  • Keywords
    Sputter yield , TOF-SIMS , Cluster ion , Water ice , C60+
  • Journal title
    Applied Surface Science
  • Serial Year
    2006
  • Journal title
    Applied Surface Science
  • Record number

    1002374