Title of article
Fundamental studies of the cluster ion bombardment of water ice
Author/Authors
Christopher Szakal، نويسنده , , Joseph Kozole، نويسنده , , Nicholas Winograd، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
3
From page
6526
To page
6528
Abstract
The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native
environment. We report on a method of studying amorphous water ice films of precise thicknesses in which pure water vapor is condensed onto a
pre-cooled, silver-coated quartz crystal microbalance (QCM). This scheme allows for the determination of water ice sputter yields for any primary
projectile as well as providing a means for studying escape depths of atoms and molecules beneath the deposited water ice layer. Specifically, we
find a removal of approximately 2500 water molecule equivalents/20 keV C60
+ projectile with an underlying silver ion escape depth of 7.0 A°
Keywords
Sputter yield , TOF-SIMS , Cluster ion , Water ice , C60+
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002374
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