• Title of article

    Information from complexity: Challenges of TOF-SIMS data interpretation

  • Author/Authors

    Daniel J. Graham، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    9
  • From page
    6860
  • To page
    6868
  • Abstract
    Time-of-flight secondary ion mass spectrometry (TOF-SIMS) data are complex, even for the simplest systems. Yet it is within this complexity that information about sample composition, molecular orientation, surface order, chemical bonding, sample purity, etc., is contained. The challenge is how to easily extract this information from the spectra and images. Multivariate analysis (MVA) has shown promise in taming the complexity challenges presented by TOF-SIMS data while using all the information in the entire spectrum. The recent success of MVA methods such as principal component analysis (PCA) and partial least squares (PLS) in the spectroscopic and imaging analysis of organic and biological materials has led to a great increase in the interest of MVA processing of TOF-SIMS data. However, there is still a need to better understand what data to use to answer a given question, how to optimally process the data before applyingMVA, and how to correctly interpret theMVA results. The challenges of TOF-SIMS data interpretation will only get more complex, especially for biological samples, further increasing the need for wellcontrolled MVA methodologies.
  • Keywords
    Multivariate analysis , Adsorbed proteins , ToF-SIMS , Principal component analysis , Self-assembled monolayers
  • Journal title
    Applied Surface Science
  • Serial Year
    2006
  • Journal title
    Applied Surface Science
  • Record number

    1002452