Title of article
Structural and optical characterization of the propolis films
Author/Authors
S.I. Drapak، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
279
To page
282
Abstract
We have performed structural and optical characterizations of the propolis (an organic entity of biological nature) films grown on various nonorganic
substrates. The films were grown from a propolis melt or a propolis alcohol solution. The crystal structure has been observed in the films
precipitated from the solution onto substrates such as an amorphous glass and sapphire or semiconductor indium monoselenide. For any growth
method, the propolis film is a semiconductor with the bandgap of 3.07 eVat 300 K that is confirmed by a maximum in photoluminescence spectra at
2.86 eV. We argue that propolis films might be used in various optoelectronic device applications
Keywords
morphology , Semiconductor , heterostructure
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002838
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