Title of article
Microstructure effect on microtopography of chemically etched a + b Ti alloys
Author/Authors
P.Y. Lim، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
10
From page
449
To page
458
Abstract
Microstructure effect on chemical etching behavior of the annealed Ti–6Al–4Vand Ti–3Al–2.5V titanium (Ti) alloys was compared with that of
unalloyed commercially pure titanium. The microstructural evolution of structure phases after annealing the titanium and its alloys at temperature
near and above b transus and followed by furnace cooling to room temperature was studied using optical microscope, scanning electron microscope
and X-ray diffraction techniques. The microstructure study illustrates that the heat treatment enhanced partitioning effect allows extensive
formation of hemispherical and near spherical pits roughened surface to be readily acquired by chemically etching the annealed a + b titanium
alloys. The kinetics of the chemical etching reaction process show a linear dependence on time. The annealed a + b titanium alloys that exhibit
relatively lower weight loss and thickness reduction rate illustrate less chemical activity than the annealed unalloyed titanium.
Keywords
profilometry , SEM , Roughness , immersion test , Chemical etching , Titanium
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002872
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