• Title of article

    Microstructure effect on microtopography of chemically etched a + b Ti alloys

  • Author/Authors

    P.Y. Lim، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    10
  • From page
    449
  • To page
    458
  • Abstract
    Microstructure effect on chemical etching behavior of the annealed Ti–6Al–4Vand Ti–3Al–2.5V titanium (Ti) alloys was compared with that of unalloyed commercially pure titanium. The microstructural evolution of structure phases after annealing the titanium and its alloys at temperature near and above b transus and followed by furnace cooling to room temperature was studied using optical microscope, scanning electron microscope and X-ray diffraction techniques. The microstructure study illustrates that the heat treatment enhanced partitioning effect allows extensive formation of hemispherical and near spherical pits roughened surface to be readily acquired by chemically etching the annealed a + b titanium alloys. The kinetics of the chemical etching reaction process show a linear dependence on time. The annealed a + b titanium alloys that exhibit relatively lower weight loss and thickness reduction rate illustrate less chemical activity than the annealed unalloyed titanium.
  • Keywords
    profilometry , SEM , Roughness , immersion test , Chemical etching , Titanium
  • Journal title
    Applied Surface Science
  • Serial Year
    2006
  • Journal title
    Applied Surface Science
  • Record number

    1002872