Characterization of conductance under finite bias for a self-assembled monolayer coated Au quantized point contact

We have demonstrated that an experimental cross-wire junction set-up can be used to measure the I–V characteristics of a self-assembled monolayer (SAM) stabilized metal quantized point contact. The increased stability due to the presence of the SAM allows the measurement of the I–V characteristics. However, the SAM also provides additional conductance paths in addition to the pure metal point contact. The presence of the SAM may contribute to the non-integral quantum conductance transition and the non-linear I–V characteristics of the quantum contact. Nonetheless, a straight I–V curve is obtained for the Au quantized point contact from 0 to 1 V with a conductance of approximately 1G0, in contrast to previous work reported in the literature.