Title of article
ZnSe sintered films: Growth and characterization
Author/Authors
Vipin Kumar، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
4
From page
3543
To page
3546
Abstract
The II–VI compound semiconductor, ZnSe having wide band gap between 2.58 and 2.82 eV is a promising material for use in photovoltaic
devices, blue light emitting diodes and laser diodes. Several methods have been used to prepare ZnSe thin films.We have deposited ZnSe films on
ultra-clean glass substrate by sintering technique. The optical, structural and electrical properties of ZnSe thin films have been examined. The
optical band gap of these films is studied using reflection spectra in wavelength range 325–600 nm and structure of these films is studied using
XRD. The DC conductivity of the films was measured in vacuum by two-probe technique.
Sintering is a very simple and viable method compared to other intensive methods. The results of the present investigation will be useful in
characterizing the material ZnSe for its applications in photovoltaics
Keywords
Band gap , Screen-printing , Reflection spectra , semiconductors , sintering , Conductivity
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1003366
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