Title of article
Light induced adsorption of Si nano-composites in LiF crystals at 157 nm
Author/Authors
E. Sarantopoulou، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
7
From page
4438
To page
4444
Abstract
Si nano-composites were precipitated on LiF crystals following ablation from Si targets with laser light at 157 nm. The LiF/Si interface was
analyzed with scanning electron microscopy, atomic force microscopy and energy dispersive X-ray microanalysis. It was found that Si composites
were strongly attached to LiF ionic sites to form inhomogeneous structures consisted of small isotropic crystals 0.1–1 mm long, rich in Si and
fluorine, which eventually further agglomerate to form larger structures. The thickness of the LiF/Si interface was increased from 50 nm to 2 mm
following laser irradiation at 157 nm, due to accelerated adsorption of Si in the LiF interface by VUV light.
Keywords
157 nm laser , interfaces , Vacuum ultraviolet light , Silicon adsorption in LiF , Silicon contamination
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1003508
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