Title of article
Microstructure and nanohardness of the diluted magnetic semiconducting Cd1 xMnxS nano-crystalline films
Author/Authors
D. Sreekantha Reddy، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
5
From page
7318
To page
7322
Abstract
Cd1 xMnxS nano-crystalline films (0 x 0.5) were formed on glass substrates by thermal evaporation technique at room temperature
(300 K). AFM studies showed that all the films were in nano-crystalline form with the grain size varying in the range between 36 and 58 nm and
exhibited hexagonal structure of the host material. The lattice parameters varied linearly with composition, following Vegard’s law in the entire
composition range. The nanohardness and Young’s modulus decreased sharply with ‘Mn’ content upto x = 0.3 and increased with high Mn content
Keywords
Nanohardness and Young’s modulus , Cd1 xMnxS nano-crystalline films , Microstructure , Diluted magnetic semiconductors
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1003983
Link To Document