• Title of article

    Characteristics of plate-like and color-zoning cubic boron nitride crystals

  • Author/Authors

    Shuang Feng، نويسنده , , Lixin Hou، نويسنده , , Xiuhuan Liu، نويسنده , , Yanjun Gao، نويسنده , , Xinlu Li، نويسنده , , Qi Wang، نويسنده , , Zhanguo Chen، نويسنده , , Gang Jia، نويسنده , , Zhi-Jie Zheng، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2013
  • Pages
    6
  • From page
    817
  • To page
    822
  • Abstract
    The polarities of a kind of plate-like and color-zoning cubic boron nitride (cBN) crystal were extensively investigated by microscopy, chemical etching, XPS, Raman scattering, and current–voltage measurements. The {1 1 1}B faces and image faces of the cBN samples can be easily distinguished by optical microscope as there are a lot of defects incorporate in image sectors serving as the color centers, while the {1 1 1}B sectors have less defects and are nearly colorless. Both XPS and Raman spectra also revealed the uneven distributions of N vacancies and substitutional impurities in cBN crystals. The determination of {1 1 1}B faces and image faces can also be verified by the results of the chemical etching because the image faces have much faster etch rates than the {1 1 1}B faces. According to XPS, the {1 1 1}B faces have more C and O contaminations than the image faces, however the image faces have larger atomic ratio of B:N after surface cleaning by Ar+ sputtering. In the Raman spectra of the image sectors of cBN, several small broad infrared-active phonon bands emerge nearby TO and LO modes because of the disorder-activated Raman scattering. As for the {1 1 1}B sectors, this phenomenon disappears. In addition, the {1 1 1}B faces have much smaller leakage current than the image faces, which indicates that the {1 1 1}B sectors have higher crystalline quality.
  • Keywords
    III–V compounds , Cubic boron nitride , Surface polarity , Wide bandgap semiconductors
  • Journal title
    Applied Surface Science
  • Serial Year
    2013
  • Journal title
    Applied Surface Science
  • Record number

    1008180