• Title of article

    Relationship between structure and deposition conditions for CuInO2 thin films

  • Author/Authors

    C. Yaicle، نويسنده , , A. Blacklocks، نويسنده , , A.V. Chadwick، نويسنده , , J. Perrière، نويسنده , , A. Rougier، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    4
  • From page
    1343
  • To page
    1346
  • Abstract
    CuInO2 thin films were deposited using the Pulsed Laser Deposition technique. The influence of various deposition parameters and mainly the oxygen pressure on the texture, composition and structure of the films is discussed. Films deposited with an oxygen pressure in the 0.2–1 Pa range exhibit the delafossite structure. Higher pressure introduces an increase in the oxygen content leading to a CuInO2.10 composition for the film deposited at 5 Pa and a progressive loss of the delafossite structure. As confirmed by an EXAFS study, the oxygen stoichiometry controls the Cu+/Cu2+ ratio.
  • Keywords
    Pulsed laser deposition , Thin films , Copper indium oxide , Delafossite , EXAFS , Stoichiometry , Oxygen pressure
  • Journal title
    Applied Surface Science
  • Serial Year
    2007
  • Journal title
    Applied Surface Science
  • Record number

    1008702