Title of article
Analysis of the electronic configuration of the pulsed laser deposited La0.7Ca0.3MnO3 thin films
Author/Authors
C.N. Borca، نويسنده , , S. Canulescu، نويسنده , , F. Loviat، نويسنده , , T. Lippert، نويسنده , , D. Grolimund ، نويسنده , , M. D?beli، نويسنده , , J. Wambach، نويسنده , , A. Wokaun، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
4
From page
1352
To page
1355
Abstract
The electronic properties of La0.7Ca0.3MnO3−δ thin films grown by the pulsed reactive crossed beam laser ablation method are investigated. The effects of post-deposition annealing of epitaxial La0.7Ca0.3MnO3−δ thin films have been investigated using X-ray photoelectron spectroscopy (surface sensitive) and hard X-ray absorption spectroscopy (bulk sensitive). The films deposited in the high vacuum are oxygen deficient and contain mostly Mn3+. High temperature annealing in a flowing oxygen atmosphere partially changes the Mn oxidation state from +3 towards +3.4. These changes should favor a metal-like conduction and a ferromagnetic double exchange transport mechanism in the annealed thin films.
Keywords
Pulsed laser deposition , Thin films of manganates , X-ray photoemission spectroscopy , X-ray absorption spectroscopy
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1008704
Link To Document