Title of article
XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5 mol% H2/Ar) atmosphere
Author/Authors
S. Achiwawanich، نويسنده , , B.D. James، نويسنده , , J. Liesegang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
12
From page
2388
To page
2399
Abstract
Surface effects on Mong Hsu rubies and Kanchanaburi sapphires after heat treatment in a controlled reducing atmosphere (5 mol% H2/Ar) have been investigated using advanced surface science techniques including X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). Visual appearance of the gemstones is clearly affected by the heat treatment in a reducing atmosphere. Kanchanaburi sapphires, in particular, exhibit Fe-containing precipitates after the heat treatment which have not been observed in previous studies under an inert atmosphere. Significant correlation between changes in visual appearance of the gemstones and variations in surface concentration of trace elements, especially Ti and Fe are observed. The XPS and ToF-SIMS results suggest that; (1) a reducing atmosphere affects the oxidation state of Fe; (2) dissociation of Fe–Ti interaction may occur during heat treatment.
Keywords
Heat treatment , Photoelectron spectroscopy , Sapphire , Secondary ion mass spectrometry , Ruby , Surface analysis
Journal title
Applied Surface Science
Serial Year
2008
Journal title
Applied Surface Science
Record number
1010033
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