• Title of article

    XPS and ToF-SIMS analysis of natural rubies and sapphires heat-treated in a reducing (5 mol% H2/Ar) atmosphere

  • Author/Authors

    S. Achiwawanich، نويسنده , , B.D. James، نويسنده , , J. Liesegang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2008
  • Pages
    12
  • From page
    2388
  • To page
    2399
  • Abstract
    Surface effects on Mong Hsu rubies and Kanchanaburi sapphires after heat treatment in a controlled reducing atmosphere (5 mol% H2/Ar) have been investigated using advanced surface science techniques including X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). Visual appearance of the gemstones is clearly affected by the heat treatment in a reducing atmosphere. Kanchanaburi sapphires, in particular, exhibit Fe-containing precipitates after the heat treatment which have not been observed in previous studies under an inert atmosphere. Significant correlation between changes in visual appearance of the gemstones and variations in surface concentration of trace elements, especially Ti and Fe are observed. The XPS and ToF-SIMS results suggest that; (1) a reducing atmosphere affects the oxidation state of Fe; (2) dissociation of Fe–Ti interaction may occur during heat treatment.
  • Keywords
    Heat treatment , Photoelectron spectroscopy , Sapphire , Secondary ion mass spectrometry , Ruby , Surface analysis
  • Journal title
    Applied Surface Science
  • Serial Year
    2008
  • Journal title
    Applied Surface Science
  • Record number

    1010033