• Title of article

    Massive transfer of vertically aligned Si nanowire array onto alien substrates and their characteristics

  • Author/Authors

    Shu-Chia Shiu، نويسنده , , Shih-Che Hung، نويسنده , , Jiun-Jie Chao، نويسنده , , Ching-Fuh Lin، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2009
  • Pages
    5
  • From page
    8566
  • To page
    8570
  • Abstract
    Si nanowires (NWs) are promising materials for future electronic, photovoltaic, and sensor applications. So far the Si NWs are mainly formed on particular substrates or at high temperatures, greatly limiting their application flexibility. Here we report a low temperature process for forming and massively transferring vertically aligned Si NWs on alien substrates with a large density of about (3–5) × 107 NWs/mm2. The X-ray diffraction spectrum reveals that the transferred NWs exhibit almost the same crystal property as the bulk Si. Our investigation further shows that the transferred NWs have exceptional optical characteristics. The transferred Si NWs of 12.14 μm exhibit the transmittance as low as 0.3% in the near infrared region and 0.07% in the visible region. The extracted absorption coefficient of Si NWs in the near infrared region is about 3 × 103 cm−1, over 30 times larger than that of the bulk Si. Because of the low temperature process, it enables a large variety of alien substrates such as glass and plastics to be used. In addition, the exceptional properties of the transferred NWs offer potential applications for photovoltaic, photo-detectors, sensors, and flexible electronics.
  • Keywords
    transfer , X-ray diffraction , Silicon nanowire , Optical absorption
  • Journal title
    Applied Surface Science
  • Serial Year
    2009
  • Journal title
    Applied Surface Science
  • Record number

    1012127