• Title of article

    Crystallization of amorphous Si3N4 and superhardness effect in HfC/Si3N4 nanomultilayers

  • Author/Authors

    Guanqun Li، نويسنده , , Yuge Li، نويسنده , , Geyang Li *، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    4
  • From page
    5799
  • To page
    5802
  • Abstract
    HfC/Si3N4 nanomultilayers with various thicknesses of Si3N4 layer have been prepared by reactive magnetron sputtering. Microstructure and mechanical properties of the multilayers have been investigated. The results show that amorphous Si3N4 is forced to crystallize and grow coherently with HfC when the Si3N4 layer thickness is less than 0.95 nm, correspondingly the multilayers exhibit strong columnar structure and achieve a significantly enhanced hardness with the maximum of 38.2 GPa. Further increasing Si3N4 layer thickness leads to the formation of amorphous Si3N4, which blocks the coherent growth of multilayer, and thus the hardness of multilayer decreases quickly.
  • Keywords
    HfC/Si3N4 nanomultilayer , Coherent growth , Crystallization of amorphous , Superhardness effect
  • Journal title
    Applied Surface Science
  • Serial Year
    2011
  • Journal title
    Applied Surface Science
  • Record number

    1014248