• Title of article

    Chemical bonds studied with functionalized atomic force microscopy tips

  • Author/Authors

    Taejoon Han، نويسنده , , John M. Williams، نويسنده , , Thomas P. Beebe Jr.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1995
  • Pages
    12
  • From page
    365
  • To page
    376
  • Abstract
    Chemically modified atomic force microscopy (AFM) tips were produced by using thiol molecules. A new statistical method which produces information about single chemical bond strength from the retracting part of the force-distance curves in AFM is discussed. Single hydrogen bonds between car☐ylic acid groups on the tip and surface were detected, and the hydrogen bond energy between them was calculated. This measured single hydrogen bond strength shows variation in various liquid media. From the shape of the approaching part of the force-distance curves, we were able to confirm the presence of surface hydrogen bond forces, as well as infer other effects such as hydration shell and electric double-layer repulsion. The experiments represent an important step in rendering the information in AFM chemically specific.
  • Keywords
    Surface techniques , atomic force microscopy , Thiols , hydrogen bonds
  • Journal title
    Analytica Chimica Acta
  • Serial Year
    1995
  • Journal title
    Analytica Chimica Acta
  • Record number

    1022359