Adjacent track erasure analysis and modeling at high track density

The issues of the adjacent track erasure problems have been studied for high track density (TPI) situations using dc erasure at adjacent tracks. It is found that a significant portion of the BER degradation is due to the stray field from the vicinity of the write gap. Finite element method (FEM) calculations were carried out for studying the field in the vicinity of the write gap. Furthermore, we have incorporated FEM results into micromagnetic simulation of conventional media to simulate the actual side writing and erasure processes. The simulation results confirmed the RMS loss of SNR due to multiple adjacent dc erasure. The obtained experimental results indeed are quite consistent with the modeling results.