Temperature dependence of the electron distribution in a GaAs matrix with embedded InAs quantum dots

We report on the effect of the Debye averaging process on the CV characteristics of a sample containing four coupled planes of InAs self-assembled quantum dots. The observed electron distribution presented a dynamical dependence of the temperature during the C–V measurements which was explained in terms of the screening length dependence on the temperature. In addition, using the C–V data, we calculated the electron density at the planes containing the InAs dots and we have observed a high-temperature stability: the electron density at the quantum dots remained constant over a large range of temperature.