Title of article
Interface-roughness scattering and magnetoresistance in thin AlP(1 0 0) quantum well structures
Author/Authors
A. Gold، نويسنده , , René R. Marty، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2008
Pages
3
From page
2028
To page
2030
Abstract
We present theoretical results of the transport scattering time, the single-particle relaxation time and the magnetoresistance in a parallel magnetic field for thin AlP quantum well structures in the case of interface-roughness scattering. We show how measurements of transport properties can be used to obtain information about the scattering mechanism.
Keywords
Interface-roughness scattering , Dingle temperature , Magnetoresistance , AlP quantum wells
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2008
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1047281
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