Growth of Al-doped ZnO nanorod arrays on the substrate at low temperature

Aluminum-doped zinc oxide nanorod arrays are deposited on glass by a solution method at low temperature (80 °C). The as-grown samples are characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), UV–vis spectroscopy and Raman spectroscopy. We observe that Raman spectroscopy of aluminum-doped zinc oxide nanorods is different from undoped zinc oxide nanorods. The intensity of Raman peak at 437 cm−1 decreases for aluminum-doped zinc oxide nanorods sample while a peak at 750 cm−1 appears. X-ray diffraction (XRD) shows aluminum-doped zinc oxide nanorods grown in (0 0 2) orientation.