• Title of article

    Atomic-scale characterization of silicon diffusion on carbon nanotubes

  • Author/Authors

    Hongyu Zhang، نويسنده , , Xuejuan Zhang، نويسنده , , Mingwen Zhao، نويسنده , , Zhenhai Wang، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2010
  • Pages
    4
  • From page
    610
  • To page
    613
  • Abstract
    Adsorption and diffusion of silicon on the exterior surface of carbon nanotubes are crucial for the growth of silicon carbide nanotubes (SiCNTs) from carbon nanotubes. We have carried out first-principles calculations to explore these processes. We found that a silicon atom prefers to be adsorbed at the bridge site above a C−C bond tilted to the tube axis with binding energy of 1.29−1.61 eV. The adsorbed silicon atoms have high mobility with diffusion energy barriers less than 0.06 eV. The energetically favorable diffusion paths are oriented along the tube axis.
  • Journal title
    Physica E Low-dimensional Systems and Nanostructures
  • Serial Year
    2010
  • Journal title
    Physica E Low-dimensional Systems and Nanostructures
  • Record number

    1048594