Title of article
PERMITTIVITY MEASUREMENT OF THIN DIELECTRIC MATERIALS FROM REFLECTION-ONLY MEASUREMENTS USING ONE-PORT VECTOR NETWORK ANALYZERS
Author/Authors
By U. C. Hasar ، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2009
Pages
16
From page
365
To page
380
Abstract
We have proposed a simple waveguide method for complex permittivity determination of dielectric materials which are not completely filling the entire sample holder. The method reconstructs the permittivity from measured reflection-only scattering paramete
Journal title
Progress In Electromagnetics Research
Serial Year
2009
Journal title
Progress In Electromagnetics Research
Record number
1055007
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