Title of article
Polaronic relaxation in La0.8Bi0.2Fe0.7Mn0.3O3
Author/Authors
K.B. Xu، نويسنده , , C.C. Wang، نويسنده , , M.N. Zhang، نويسنده , , G.J. Wang، نويسنده , , Y.M. Cui، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2012
Pages
4
From page
499
To page
502
Abstract
In this work, the dielectric properties of La0.8Bi0.2Fe0.7Mn0.3O3 ceramics have been investigated in a temperature range of 76–320 K and a frequency range of 300 Hz–10 MHz. Two thermally activated dielectric relaxations were observed with the activation energy around 0.283 ± 0.007 eV for the low-temperature relaxation and 0.268 ± 0.007 eV for the high-temperature relaxation. Annealing in N2 and O2 can destroy and create the high-temperature relaxation, respectively. But the treatments have no significant influence on the low-temperature relaxation. The low-temperature relaxation was found to be bulk effect related to the dipolar effect due to the hopping polarons, and the high-temperature relaxation was associated with the Maxwell–Wagner relaxation due to surface-layer effect caused by hopping polarons blocked and trapped at the surfaces of the sample.
Keywords
Ceramics , Dielectric properties , Annealing , X-ray scattering
Journal title
Materials Chemistry and Physics
Serial Year
2012
Journal title
Materials Chemistry and Physics
Record number
1059564
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