Title of article
Stoichiometry control and point defects in compound semiconductors
Author/Authors
Jun-ichi Nishizawa، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2000
Pages
23
From page
93
To page
115
Abstract
For many years, deviations of stoichiometry correlated with the density of point defects; interstitials, vacancies, anti-sites, etc. has been neglected. However, control of these by vapor pressure showed significant effects on the properties of compound materials; moreover, crystal growth under controlled vapor pressure also produced nearly perfect crystals of very high quality. Also, some considerations based on the thermodynamics are described.
Keywords
Point defects , Annealing , Crystal growth , Characterization , Compound semiconductors , Stoichiometry
Journal title
Materials Chemistry and Physics
Serial Year
2000
Journal title
Materials Chemistry and Physics
Record number
1060267
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