Title of article
Study of the Raman spectrum of CeO2 nanometer thin films
Author/Authors
Shengyue Wang، نويسنده , , Wei Wang، نويسنده , , Jian Zuo، نويسنده , , Yitai Qian، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2001
Pages
3
From page
246
To page
248
Abstract
The Raman spectra of CeO2 (4.2–20 nm) nanometer thin films deposited by spray pyrolysis are measured at room temperature in various ratios of pulse time to interval time between pulses. The results show that there is a difference from that of single-crystal or polycrystalline CeO2; in the latter, there appear two new characteristic Raman peaks at shifts of 270 and 315 cm−1, whose intensities decrease swiftly with the increase of crystallite sizes. The new peaks can be explained as surface phonon modes of nanometer CeO2. The relationships between the intensities of peaks, crystallite sizes and the ratio of pulse time to interval time are discussed.
Keywords
Nanostructure , Cerium oxide , Raman spectra , Spray pyrolysis , Thin film
Journal title
Materials Chemistry and Physics
Serial Year
2001
Journal title
Materials Chemistry and Physics
Record number
1060470
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