• Title of article

    Statistics on the AC ageing characteristics of single grain boundaries of ZnO varistor

  • Author/Authors

    Jun Liu، نويسنده , , Jinliang He، نويسنده , , Jun Hu، نويسنده , , Wangcheng Long، نويسنده , , Fengchao Luo، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2011
  • Pages
    3
  • From page
    9
  • To page
    11
  • Abstract
    The statistical AC ageing characteristics of single grain boundaries of ZnO varistor were investigated in this paper using the microcontact measurement method. ZnO varistor sample deposited with micro-electrodes was degraded under the ageing stress of 0.85 V1mA at 135 °C. The electrical properties of 100 grain boundaries were measured after ageing with different time. The results indicate that the distribution of nonlinear coefficients concentrates to the lower region and the leakage current gradually increases in the ageing process. Meanwhile, more grain boundaries with lower breakdown voltage emerge as the ageing time increases, which means that the nonlinearities of these grain boundaries become weak.
  • Keywords
    Electrical properties , Ceramics , Ageing , Semiconductors
  • Journal title
    Materials Chemistry and Physics
  • Serial Year
    2011
  • Journal title
    Materials Chemistry and Physics
  • Record number

    1062788