Title of article
Statistics on the AC ageing characteristics of single grain boundaries of ZnO varistor
Author/Authors
Jun Liu، نويسنده , , Jinliang He، نويسنده , , Jun Hu، نويسنده , , Wangcheng Long، نويسنده , , Fengchao Luo، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2011
Pages
3
From page
9
To page
11
Abstract
The statistical AC ageing characteristics of single grain boundaries of ZnO varistor were investigated in this paper using the microcontact measurement method. ZnO varistor sample deposited with micro-electrodes was degraded under the ageing stress of 0.85 V1mA at 135 °C. The electrical properties of 100 grain boundaries were measured after ageing with different time. The results indicate that the distribution of nonlinear coefficients concentrates to the lower region and the leakage current gradually increases in the ageing process. Meanwhile, more grain boundaries with lower breakdown voltage emerge as the ageing time increases, which means that the nonlinearities of these grain boundaries become weak.
Keywords
Electrical properties , Ceramics , Ageing , Semiconductors
Journal title
Materials Chemistry and Physics
Serial Year
2011
Journal title
Materials Chemistry and Physics
Record number
1062788
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