• Title of article

    Unusual properties of metastable (Ga, In)(N,As) containing semiconductor structures

  • Author/Authors

    P.J.، Klar, نويسنده , , L.، Hui Chen, نويسنده , , J.، Koch, نويسنده , , W.، Heimbrodt, نويسنده , , K.، Volz, نويسنده , , W.، Stolz, نويسنده , , H.، Riechert, نويسنده , , L.، Geelhaar, نويسنده , , A.، Polimeni, نويسنده , , M.، Capizzi, نويسنده , , H.، Gruning, نويسنده , , T.، Hartmann, نويسنده , , D.، Golde, نويسنده , , M.، Gungerich, نويسنده , , B.، Kunert, نويسنده , , T.، Torunski, نويسنده , , G.، Dumitras, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -27
  • From page
    28
  • To page
    0
  • Abstract
    An overview is presented of experimental and theoretical work on band structure aspects of (Ga,In)(N,As) and Ga(N,As) quantum well structures and epitaxial layers grown by molecular beam epitaxy (MBE) and metal-organic vapour phase epitaxy (MOVPE). The evolution of unusual band structure and phonon features in GaN/sub x/As/sub 1-x/ with increasing x caused by the impurity character of nitrogen in GaAs is discussed. Hydrogenation of Ga(N,As) allows one to virtually switch off the N-induced changes of the band structure and the vibrational modes. A strong blue shift up to about 100 meV of the bandgap of quaternary samples is observed on thermal annealing. The magnitude of the blue shift depends strongly on In and N concentrations as well as on the growth and annealing conditions. Raman spectra of MOVPE-grown (Ga,In)(N,As) epitaxial layers reveal local In-N and Ga-N modes. On annealing, the intensity ratios of the local modes change, indicating a rearrangement of the nitrogen nearest-neighbour environments from Ga-rich to In-rich environments. Tight binding calculations suggest that this might contribute strongly to the observed blue shift. Other possible contributions to the blue shift are also discussed.
  • Keywords
    Distributed systems
  • Journal title
    IEE PROCEEDINGS OPTOELECTRONICS
  • Serial Year
    2003
  • Journal title
    IEE PROCEEDINGS OPTOELECTRONICS
  • Record number

    106776