Characterization of surface contact-induced fracture in ceramics using a focused ion beam miller

Focused ion beam (FIB) milling and imaging are powerful techniques for evaluation of surface contact-induced crack structures and the effect of microstructure on crack growth in ceramics. Two distinct α-sialon microstructures made from the same composition were tested under indentation, scratching and grinding conditions. Following each test, the FIB was used to analyze fracture events in both the surface and subsurface, and reveal the factors that control material removal during surface contact.