Title of article
A new wavelet filtering for analysis of fractal engineering surfaces
Author/Authors
P. Bakucz، نويسنده , , R. Krüger-Sehm، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2009
Pages
4
From page
539
To page
542
Abstract
Recently B-spline wavelets (ISO 16610-29) have been accepted in precision engineering as an official Technical Specification for analyzing engineering surfaces. However, in some applications where fractal signals are involved it is better that the wavelet behaves like a fractional differentiator. The purpose of this paper is to introduce a fractional spline wavelet-based framework for analyzing fractal engineering surfaces. We will use the orthonormal fractional spline wavelet filter and develop an algorithm for the implementation of the associated wavelet transform. We illustrate our method by considering PTB roughness standards.
Keywords
Engineering surfaces , Wavelet filter , Nanometrology , Fractal geometry
Journal title
Wear
Serial Year
2009
Journal title
Wear
Record number
1090507
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