Title of article
Imaging defects and junctions in single-walled carbon nanotubes by voltage-contrast scanning electron microscopy Original Research Article
Author/Authors
Aravind Vijayaraghavan، نويسنده , , Christoph W. Marquardt، نويسنده , , Simone Dehm، نويسنده , , Frank Hennrich، نويسنده , , Ralph Krupke، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2010
Pages
7
From page
494
To page
500
Abstract
Voltage-contrast scanning electron microscopy is demonstrated as a new technique to locate and characterize defects in single-walled carbon nanotubes. This method images the surface potential along and surrounding a nanotube in device configuration and it
Journal title
Carbon
Serial Year
2010
Journal title
Carbon
Record number
1126492
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