Title of article
Nondestructive Quantitative Dopant Profiling Technique by Contact Radiography
Author/Authors
Chen، K. C. نويسنده , , Stephens، R. B. نويسنده , , Nikroo، A. نويسنده , , Huang، H. نويسنده , , Eddinger، S. A. نويسنده , , Gunther، J. نويسنده , , Xu، H. W. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
-64
From page
65
To page
0
Abstract
We have developed the only non-destructive technique to profile graded dopants in ICF shells to the precision required by the NIF specifications (Doping level must be accurate to 0.03 at. % and its radial distribution accurate to submicron precision). This quantitative contact radiography method was based on precision film digitization and a dopant simulation model. The measurements on Cu\Be and Ge/CH shells agree with those from electron microprobe and X-ray fluorescence.
Keywords
cone shell , fast heating , fast ignition
Journal title
FUSION SCIENCE AND TECHNOLOGY
Serial Year
2006
Journal title
FUSION SCIENCE AND TECHNOLOGY
Record number
112759
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