Title of article
Interfaces and stresses in thin films Original Research Article
Author/Authors
F Spaepen، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2000
Pages
12
From page
31
To page
42
Abstract
A review of the current understanding of the effect of interfaces on the intrinsic stresses in polycrystalline thin films is given. Special attention is paid to the measurement, modeling and application of surface and interface stresses. Mechanisms for generating the compressive and tensile components of the intrinsic stress are assessed. Prospects for future research are presented.
Keywords
Interfaces , Grain boundaries , stress , Physical vapor deposition , Thin films
Journal title
ACTA Materialia
Serial Year
2000
Journal title
ACTA Materialia
Record number
1139390
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