Title of article
Roughness effect on the measurement of interface stress Original Research Article
Author/Authors
G. Palasantzas، نويسنده , , J.Th.M. De Hosson، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2000
Pages
5
From page
3641
To page
3645
Abstract
Stimulated by a recent paper by Spaepen (Acta mater. 48 (2000) 31) we concentrate on the effect of roughness parameters on stress measurements in thin films for self-affine and mound rough interfaces. A self-affine interface is characterized by a lateral correlation length ξ, an rms roughness amplitude σ, and a roughness exponent H (0
Keywords
Mesostructure , Thin films , Grain boundaries , Interfaces , stress
Journal title
ACTA Materialia
Serial Year
2000
Journal title
ACTA Materialia
Record number
1139709
Link To Document