• Title of article

    Mapping nanoscale wear field by combined atomic force microscopy and digital image correlation techniques Original Research Article

  • Author/Authors

    Zhihui Xu، نويسنده , , Michael A. Sutton، نويسنده , , Xiaodong Li، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2008
  • Pages
    6
  • From page
    6304
  • To page
    6309
  • Abstract
    Surface wear of coatings occurring at extremely low loads and in nanocontacts is of great importance for the development and the reliability of structural/functional nanocomponents in micro/nanoelectromechanical systems. To date, appropriate tools for mapping the nanoscale wear of thin coatings are still lacking. In this study, a new method combining atomic force microscopy (AFM) and digital image correlation (DIC) techniques has been developed and applied for the determination and visualization of the nanoscale wear of a gold coating. It has been shown that the initiation and development of nanowear, which is usually difficult to detect directly from AFM topographical images, can be efficiently revealed by monitoring the correlation coefficient change in DIC analysis. A linear relation between the correlation coefficient and the wear depth is found and may be used to quantify the nanowear. The nanowear of gold coating is dominated by material removal without any plastic deformation.
  • Keywords
    atomic force microscopy , Nanoscale wear , Digital image correlation
  • Journal title
    ACTA Materialia
  • Serial Year
    2008
  • Journal title
    ACTA Materialia
  • Record number

    1143984