• Title of article

    Tensile behavior of Al1−xMox crystalline and amorphous thin films Original Research Article

  • Author/Authors

    D.S. Gianola، نويسنده , , D. Z. Lee، نويسنده , , C. Ophus، نويسنده , , E.J. Luber، نويسنده , , D. Mitlin، نويسنده , , U. DAHMEN، نويسنده , , K.J. Hemker، نويسنده , , V.R. Radmilovi?، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2013
  • Pages
    12
  • From page
    1432
  • To page
    1443
  • Abstract
    The exceptional strength and distinct deformation physics exhibited by pure ultrafine-grained and nanocrystalline metals in comparison to their microcrystalline counterparts have been ascribed to the dominant influence of grain boundaries in accommodating plastic flow. Such grain-boundary-mediated mechanisms can be augmented by additional strengthening in nanocrystalline alloys via solute and precipitate interactions with dislocations, although its potency is a function of the changes in the elastic properties of the alloyed material. In this study, we investigate the elastic and plastic properties of Al1−xMox alloys (0 ⩽ x ⩽ 0.32) by tensile testing of sputter-deposited freestanding thin films. Isotropic elastic constants and strength are measured over the composition range for which three microstructural regimes are identified, including solid solutions, face-centered cubic and amorphous phase mixtures and body-centered cubic (bcc)/amorphous mixtures. Whereas the bulk modulus is measured to follow the rule of mixtures over the Mo composition range, the Young’s and shear moduli do not. Poisson’s ratio is non-monotonic with increasing Mo content, showing a discontinuous change at the onset of the bcc/amorphous two-phase region. The strengthening measured in alloyed thin films can be adequately predicted in the solid solution regime only by combining solute strengthening with a grain boundary pinning model. The single-step co-sputtering procedure presented here results in diversity of alloy compositions and microstructures, offering a promising avenue for tailoring the mechanical behavior of thin films.
  • Keywords
    Thin films , MEMS/NEMS , Amorphous metals , Nanocrystalline metals , Elastic properties
  • Journal title
    ACTA Materialia
  • Serial Year
    2013
  • Journal title
    ACTA Materialia
  • Record number

    1146805