A novel planar mesh-type microelectromagnetic sensor. Part I. Model formulation

The formulation of analytical model and results for a novel planar mesh-type microelectromagnetic sensor for multiple applications has been reported in this paper. The sensor can be used for the estimation of near-surface properties (such as conductivity, permeability, permittivity, liftoff, etc.) of materials, inspecting the quality of electroplated materials, and has the potential of possible inspection of dairy foods, such as butter, cheese, curds, yogurts, etc. The results obtained from the analytical model for the calculation of the transfer impedance of the sensors has been discussed. The transfer impedance is used for the quality inspection of the system under test in an indirect way.