• Title of article

    Intergranular films at metal-ceramic interfaces Part II - calculation of Hamaker coefficients

  • Author/Authors

    Avishai، Amir نويسنده , , Kaplan، Wayne D. نويسنده ,

  • Pages
    -1570
  • From page
    1571
  • To page
    0
  • Abstract
    We report here theoretical calculations indicating the stability of equilibrium nanometer-thick films at metal-ceramic interfaces. Hamaker coefficients were calculated for metal-ceramic interfaces in the presence of a SiO2-based film, which indicated that a stronger attractive force is expected for intergranular films at metal-alumina interfaces, relative to alumina grain boundaries, correlating to the experimentally measured film thickness presented in part I of this report. From the combination of an attractive van der Waals force together with steric repulsion due to ordering induced in the amorphous film, a force balance can be obtained leading to the formation of equilibrated films at metal-ceramic interfaces.
  • Keywords
    Interface segregation , Ceramic matrix composites , Hamaker coefficient , TRANSMISSION ELECTRON MICROSCOPY , Interface wetting
  • Journal title
    Astroparticle Physics
  • Record number

    117375