• Title of article

    Simulation of thermal stress in magnetron sputtered thin coating by finite element analysis

  • Author/Authors

    Julfikar Haider، نويسنده , , Mahfujur Rahman، نويسنده , , Brian Corcoran، نويسنده , , A.G. Olabi and M.S.J. Hashmi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    6
  • From page
    36
  • To page
    41
  • Abstract
    Stresses due to thermal mismatch develop in thin coatings deposited by physical vapour deposition (PVD) processes when cooled down to room temperature from deposition temperature. Despite having lower processing temperature, thermal stress can be significant when a large difference in physical and thermal properties of the bonded materials exists. A 2D finite element (FE) model for coating substrate system (TiN on stainless steel) has been investigated to simulate thermal mismatch stress. Several parametric effects i.e., deposition temperature, substrate thickness, coating thickness, Youngʹs modulus, and thermal expansion coefficient were studied to get the description of the thermal stress states. The effect of interlayer material on thermal stress has also been studied. FEA results in terms of radial, shear and axial stress were compared with the analytical results and good agreement was found.
  • Keywords
    Thin coating , TIN , PVD , FEM , Thermal stress
  • Journal title
    Journal of Materials Processing Technology
  • Serial Year
    2005
  • Journal title
    Journal of Materials Processing Technology
  • Record number

    1179631