Crystallization and electrical properties of [(Pb1−xSrx)·TiO3][(2SiO2·B2O3)][K2O] glass–ceramics

The effect of compositional change on glass–ceramic formation and its electrical properties were studied. The composition was formulated with 40 wt.% of borosilicate glass, 60 wt.% of titanate and 10 wt.% of alkaline oxide. The glass samples with composition of [(Pb1−xSrx)·TiO3][(2SiO2·B2O3)][K2O] with different values of x (x = 0, 0.1, 0.2, 0.3, 0.4 and 0.5) were prepared. After heat treatment of glasses at different temperatures, which were chosen based on differential thermal analysis–DTA curves, the crystallized phase and its microstructure were studied by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The XRD and SEM results revealed the formation of ferroelectric solid solution. The data showed that crystallization of glass and the type of the structure are effective factors on dielectric properties of the system. Finally dielectric properties such as dielectric strength of glass–ceramic samples were measured. The dielectric strength was in the range of 10–20 kV and the resistivity was more than Giga range.