An analytical framework for reliability growth of one-shot systems

In this paper, we introduce a new reliability growth methodology for one-shot systems that is applicable to the case where all corrective actions are implemented at the end of the current test phase. The methodology consists of four model equations for assessing: expected reliability, the expected number of failure modes observed in testing, the expected probability of discovering new failure modes, and the expected portion of system unreliability associated with repeat failure modes. These model equations provide an analytical framework for which reliability practitioners can estimate reliability improvement, address goodness-of-fit concerns, quantify programmatic risk, and assess reliability maturity of one-shot systems. A numerical example is given to illustrate the value and utility of the presented approach. This methodology is useful to program managers and reliability practitioners interested in applying the techniques above in their reliability growth program.