Title of article
Characterization of nanoparticles by scattering techniques
Author/Authors
Chu، Benjamin نويسنده , , Liu، Tianbo نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
13
From page
29
To page
41
Abstract
Basic principles and applications of different scattering techniques (including static and dynamic light scattering (SLS and DLS), small-angle X-ray scattering (SAXS), wide-angle X-ray diffraction (WAXD) and small-angle neutron scattering (SANS)) on the characterization of nanoparticles are reviewed in this paper. By choosing a suitable scattering technique or a combination of different techniques for nanoparticle characterization, the particles’ molecular weight, radius of gyration, hydrodynamic radius, size distribution, shape and internal structure as well as interparticle interactions of nanoparticles, can be determined. Examples, including some sophisticated colloidal systems, are presented.
Keywords
nanoscale characterization , Light Scattering , SAXS , WAXD , SANS , Nanoparticle
Journal title
Journal of Nanoparticle Research
Serial Year
2000
Journal title
Journal of Nanoparticle Research
Record number
122493
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