Kelvin probe microscopy and current images of the degradation process of layered poly-3-octyl-thiophene structures

The changes in morphology and electronic properties of Poly-3-octyl-thiophene (P3OT) thin films produced by UV/ozone exposure have been studied using Scanning Force Microscopy techniques. The layered structures associated to crystalline P3OT domains on the polymer film show a better resilience to the degradation than the amorphous polymer background. In addition, the effect of the UV irradiation and ozone exposure on the electronic properties (contact potential, capacitance and conductivity) of the thin films is studied, finding that the degradation process of the electronic properties of these crystalline structures is different to those of the amorphous polymer background.