Preparation of TiO2 thin film on SiO2 glass by a spin coating–pyrolysis process

Highly transparent titanium oxide thin films were prepared on silica glass from a titanium naphthenate precursor. Films prefired at 500 °C for 30 min were heat-treated at 600 °C for 30 min in air. High resolution X-ray diffraction analysis was used for characterizing the crystallinity of the TiO2 film. A sharp absorption edge of the TiO2 film was observed. The estimated energy band gap for the film is larger than that of single crystal.