Microwave dielectric properties of diopside glass-ceramics

The effect of crystallization behaviors on the microwave dielectric properties of CaMgSi2O6 (diopside) glass-ceramics was investigated as a function of the particle size of the glass frit. The crystallization behaviors of the specimens were evaluated by differential thermal analysis (DTA) and X-ray diffraction (XRD) analysis by the combined Rietveld and reference intensity ratio (RIR) methods. With increasing particle size of the glass frit, the dielectric constant (K) and the temperature coefficient of resonant frequency (TCF) decreased. However, the quality factor (Qf) of the specimens increased up to 6.88 μm and then decreased with increasing particle size. These results could be attributed to the degree of crystallization.