Electron Beam Testing of FPGA Circuits

The growing use of FPGA circuits has made it necessary to perform accurate debug and internal testing of these circuits. To meet this challenge, we have developed an innovative method which makes it possible to use existing Electron Beam Testers to investigate the internal functionality of programmable circuits. This approach is based on the generation of a circuit layout linked to the electrical schematic for contactless measurement on the circuit. © 1999 Elsevier Science Ltd. All rights reserved.