Title of article
Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data Original Research Article
Author/Authors
V.A Streltsov، نويسنده , , P.N.H. Nakashima، نويسنده , , A.W.S Johnson، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
9
From page
2109
To page
2117
Abstract
To accurately measure the low order structure factors of α-Al2O3, two-dimensional convergent beam electron diffraction (CBED) data from parallel-sided platelets at various accelerating voltages, thickness and orientations have been matched using the Bloch-wave method. Middle and high angle extinction-free data has been obtained by the extrapolation of multi-wavelength synchrotron X-ray measurements to zero wavelength. The combination of high-energy synchrotron X-ray diffraction and CBED allows the extinction-free absolute-scale measurements and improves the reliability of the electron charge density maps in α-Al2O3.
Keywords
X-ray diffraction
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2001
Journal title
Journal of Physics and Chemistry of Solids
Record number
1307721
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