Title of article
Examination of Bragg backscattering from crystalline quartz Original Research Article
Author/Authors
John P. Sutter، نويسنده , , Alfred Q.R. Baron، نويسنده , , Tetsuya Ishikawa and Keisuke Kobayashi، نويسنده , , Hiroshi Yamazaki، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
2306
To page
2309
Abstract
The backscattering silicon single crystals normally used for hard X-ray inelastic scattering experiments suffer from parasitic reflections and gaps in photon energy where no backscattering reflection exists. Sapphire has been proposed as a possible alternative, but quartz may have advantages over sapphire at low photon energies (5–12.5 keV). Calculations of energy widths of backscattering reflections up to 30 keV for silicon, sapphire, and quartz are compared. The quartz (11 6 0) reflection is examined at 0.03° from backscattering with 0.8 meV bandwidth beam, and its energy width is measured. Finally, the thermal expansions of quartz and silicon are compared.
Keywords
A. In organic compounds , D. Thermal expansion , C. X-ray diffraction , B. Crystal Growth , D. Phonons
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2005
Journal title
Journal of Physics and Chemistry of Solids
Record number
1309234
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