Title of article
The crystallographic stability and anisotropic compressibility of C54-type TiSi2 under high pressure Original Research Article
Author/Authors
C.Y. Li، نويسنده , , Z.H. Yu، نويسنده , , H.Z. Liu، نويسنده , , T.Q. Lü، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2013
Pages
4
From page
1291
To page
1294
Abstract
In situ synchrotron X-ray powder diffraction experiment on TiSi2 has been performed using a diamond anvil cell at ambient temperature. The present experimental results showed that the structure of C54-type TiSi2 is stable in the experimental pressure range up to around 52 GPa. The compressibility of C54-type TiSi2 under high pressure presents anisotropic behavior. The compressibility along the a-, b- and c-axes has an approximate ratio of 6:5:4. And the anisotropic compressibility of the studied crystal is discussed in terms of the crystallography stacking. The c/a and b/a axial ratios both increase as the pressure increases. With pressure increasing, the c/a shows a tendency of approaching the ideal value, but the b/a deviates from the ideal value. The pressure–volume data of C54-type TiSi2 were fitted to a Birch–Murnaghan equation of state, which yielded a bulk modulus of B0=155 (2) GPa.
Keywords
D. Crystal structure , A. Intermetallic compounds , C. X-ray diffraction , C. High pressure
Journal title
Journal of Physics and Chemistry of Solids
Serial Year
2013
Journal title
Journal of Physics and Chemistry of Solids
Record number
1312000
Link To Document